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DAC
2009
ACM
16 years 1 months ago
Fault models for embedded-DRAM macros
In this paper, we compare embedded-DRAM (eDRAM) testing to both SRAM testing and commodity-DRAM testing, since an eDRAM macro uses DRAM cells with an SRAM interface. We first star...
Ching-Yu Chin, Hao-Yu Yang, Mango Chia-Tso Chao, R...
96
Voted
CEC
2010
IEEE
15 years 1 months ago
Learning to overtake in TORCS using simple reinforcement learning
In modern racing games programming non-player characters with believable and sophisticated behaviors is getting increasingly challenging. Recently, several works in the literature ...
Daniele Loiacono, Alessandro Prete, Pier Luca Lanz...
96
Voted
ICCV
2011
IEEE
14 years 20 days ago
Data-driven Crowd Analysis in Videos
In this work we present a new crowd analysis algorithm powered by behavior priors that are learned on a large database of crowd videos gathered from the Internet. The algorithm wo...
Mikel Rodriguez, Josef Sivic, Ivan Laptev, Jean-Yv...
HYBRID
2007
Springer
15 years 6 months ago
Robust Test Generation and Coverage for Hybrid Systems
Abstract. Testing is an important tool for validation of the system design and its implementation. Model-based test generation allows to systematically ascertain whether the system...
A. Agung Julius, Georgios E. Fainekos, Madhukar An...
132
Voted
MTV
2006
IEEE
98views Hardware» more  MTV 2006»
15 years 6 months ago
Directed Micro-architectural Test Generation for an Industrial Processor: A Case Study
Simulation-based validation of the current industrial processors typically use huge number of test programs generated at instruction set architecture (ISA) level. However, archite...
Heon-Mo Koo, Prabhat Mishra, Jayanta Bhadra, Magdy...