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123
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ITC
1993
IEEE
95views Hardware» more  ITC 1993»
15 years 7 months ago
Fault Diagnosis of Flash ADC using DNL Test
This paper describes a technique which uses the Differential Non Linearity (DNL) test data for fault location and identification of the analog components of a flash ADC. In a flash...
Anchada Charoenrook, Mani Soma
122
Voted
ICPPW
2009
IEEE
15 years 10 months ago
Evaluation of Existing Schedulability Tests for Global EDF
—The increasing attention on global scheduling algorithms for identical multiprocessor platforms produced different, independently developed, schedulability tests. However, the e...
Marko Bertogna
130
Voted
COMPSAC
2005
IEEE
15 years 9 months ago
Reasoning About Software Architecture-Based Regression Testing Through a Case Study
Two main issues need to be covered when dealing with the dependability of component-based systems: quality assurance of reusable software components and quality assurance of the a...
Henry Muccini, Marcio S. Dias, Debra J. Richardson
DAC
1996
ACM
15 years 7 months ago
Pseudorandom-Pattern Test Resistance in High-Performance DSP Datapaths
The testability of basic DSP datapath structures using pseudorandom built-in self-test techniques is examined. The addition of variance mismatched signals is identified as a testi...
Laurence Goodby, Alex Orailoglu
117
Voted
FORTE
1998
15 years 4 months ago
Fault-oriented Test Generation for Multicast Routing Protocol Design
Abstract: We present a new algorithm for automatic test generation for multicast routing. Our algorithm processes a nite state machine (FSM) model of the protocol and uses a mix of...
Ahmed Helmy, Deborah Estrin, Sandeep K. S. Gupta