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ISBI
2008
IEEE
16 years 7 months ago
On the uncertainty in sequential hypothesis testing
We consider the problem of sequential hypothesis testing when the exact pdfs are not known but instead a set of iid samples are used to describe the hypotheses. We modify the clas...
Antonio Artés-Rodríguez, Fernando P&...
ISSTA
2009
ACM
16 years 23 days ago
A formal analysis of requirements-based testing
The aim of requirements-based testing is to generate test cases from a set of requirements for a given system or piece of software. In this paper we propose a formal semantics for...
Charles Pecheur, Franco Raimondi, Guillaume Brat
DATE
2006
IEEE
98views Hardware» more  DATE 2006»
16 years 10 days ago
Test generation for combinational quantum cellular automata (QCA) circuits
— In this paper, we present a test generation framework for testing of quantum cellular automata (QCA) circuits. QCA is a nanotechnology that has attracted significant recent at...
Pallav Gupta, Niraj K. Jha, Loganathan Lingappan
GLVLSI
2006
IEEE
95views VLSI» more  GLVLSI 2006»
16 years 9 days ago
Test generation using SAT-based bounded model checking for validation of pipelined processors
Functional verification is one of the major bottlenecks in microprocessor design. Simulation-based techniques are the most widely used form of processor verification. Efficient ...
Heon-Mo Koo, Prabhat Mishra
CEC
2005
IEEE
15 years 12 months ago
Dynamic power minimization during combinational circuit testing as a traveling salesman problem
Testing of VLSI circuits can cause generation of excessive heat which can damage the chips under test. In the random testing environment, high-performance CMOS circuits consume sig...
Artem Sokolov, Alodeep Sanyal, L. Darrell Whitley,...