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» Testing a Safety-Critical Application

121

KBSE
1999
IEEE

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Automatic Generation of Test Oracles-From Pilot Studies to Application

15 years 8 months ago

Automatic Generation of Test Oracles-From Pilot Studies to Application

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Martin S. Feather, Benjamin D. Smith

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106

ITC
1998
IEEE

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An almost full-scan BIST solution-higher fault coverage and shorter test application time

15 years 8 months ago

An almost full-scan BIST solution-higher fault coverage and shorter test application time

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Huan-Chih Tsai, Sudipta Bhawmik, Kwang-Ting Cheng

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109

PODS
1996
ACM

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Testing Complex Temporal Relationships Involving Multiple Granularities and Its Application to Data Mining

15 years 8 months ago

Testing Complex Temporal Relationships Involving Multiple Granularities and Its Application to Data Mining

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Claudio Bettini, Xiaoyang Sean Wang, Sushil Jajodi...

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119

ICCAD
1993
IEEE

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Reconfigurable scan chains: a novel approach to reduce test application time

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Reconfigurable scan chains: a novel approach to reduce test application time

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Sridhar Narayanan, Melvin A. Breuer

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123

CRYPTO
1989
Springer

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On the Linear Consistency Test (LCT) in Cryptanalysis with Applications

15 years 8 months ago

On the Linear Consistency Test (LCT) in Cryptanalysis with Applications

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Kencheng Zeng, Chung-Huang Yang, T. R. N. Rao

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