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» Testing and built-in self-test - A survey
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ATS
1998
IEEE
170views Hardware» more  ATS 1998»
15 years 1 months ago
A Ring Architecture Strategy for BIST Test Pattern Generation
This paper presents a new effective Built-In Self Test (BIST) scheme that achieves 100% fault coverage with low area overhead, and without any modification of the circuit under tes...
Christophe Fagot, Olivier Gascuel, Patrick Girard,...
DAC
2000
ACM
15 years 10 months ago
Embedded hardware and software self-testing methodologies for processor cores
At-speed testing of GHz processors using external testers may not be technically and economically feasible. Hence, there is an emerging need for low-cost, high-quality self-test m...
Li Chen, Sujit Dey, Pablo Sanchez, Krishna Sekar, ...