2302 search results - page 29 / 461 » Testing as Abstraction |
131
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TSD
2007
Springer
15 years 11 months ago
2007
Springer
Abstract. This paper describes the design of the first large-scale IR test collection built for the Czech language. The creation of this collection also happens to be very challen...
183
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TSE
2011
15 years 11 days ago
2011
—Conventional testing methods often fail to detect hidden flaws in complex embedded software such as device drivers or file systems. This deficiency incurs significant developmen...
162
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KBSE
2008
IEEE
15 years 12 months ago
2008
IEEE
Flash memory has become virtually indispensable in most mobile devices. In order for mobile devices to successfully provide services to users, it is essential that flash memory b...
192
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ASPDAC
2004
ACM
15 years 11 months ago
2004
ACM
— We examine an abstract formulation of BIST diagnosis in digital logic systems. The BIST diagnosis problem has applications that include identification of erroneous test vector...
157
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CBSE
2004
Springer
15 years 10 months ago
2004
Springer
Abstract. This paper proposes a conceptual framework for the reliability assessment of software components that incorporates test case execution and output evaluation. Determining ...