6941 search results - page 1214 / 1389 » Testing as a Certification Approach |
115
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ICCD
2007
IEEE
16 years 1 months ago
2007
IEEE
Scan chains are widely used to improve the testability of IC designs. In traditional 2D IC designs, various design techniques on the construction of scan chains have been proposed...
143
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ICCAD
2008
IEEE
16 years 1 months ago
2008
IEEE
Abstract— Power consumption has become a crucial problem in modern circuit design. Multiple Supply Voltage (MSV) design is introduced to provide higher flexibility in controllin...
137
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ICCAD
2006
IEEE
16 years 1 months ago
2006
IEEE
In order to handle device matching in analog circuits, some pairs of modules are required to be placed symmetrically. This paper addresses this device-level placement problem for ...
129
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RECOMB
2010
Springer
15 years 11 months ago
2010
Springer
Constructing quantitative dynamic models of signaling pathways is an important task for computational systems biology. Pathway model construction is often an inherently incremental...
147
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AOSD
2009
ACM
15 years 11 months ago
2009
ACM
e is an aspect-oriented hardware verification language that is widely used to verify the design of electronic circuits through the development and execution of testbenches. In rec...