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» Testing embedded-core based system chips
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HIPEAC
2009
Springer
15 years 4 months ago
Adapting Application Mapping to Systematic Within-Die Process Variations on Chip Multiprocessors
Process variations, which lead to timing and power variations across identically-designed components, have been identified as one of the key future design challenges by the semico...
Yang Ding, Mahmut T. Kandemir, Mary Jane Irwin, Pa...
HASE
2008
IEEE
14 years 9 months ago
Randomization Based Probabilistic Approach to Detect Trojan Circuits
In this paper, we propose a randomization based technique to verify whether a manufactured chip conforms to its design or is infected by any trojan circuit. A trojan circuit can be...
Susmit Jha, Sumit Kumar Jha
ICCAD
2000
IEEE
97views Hardware» more  ICCAD 2000»
15 years 1 months ago
Error Catch and Analysis for Semiconductor Memories Using March Tests
We present an error catch and analysis (ECA) system for semiconductor memories. The system consists of a test algorithm generator called TAGS, a fault simulator called RAMSES, and...
Chi-Feng Wu, Chih-Tsun Huang, Chih-Wea Wang, Kuo-L...
IPPS
2007
IEEE
15 years 3 months ago
Exploring a Multithreaded Methodology to Implement a Network Communication Protocol on the Cyclops-64 Multithreaded Architecture
The IBM Cyclops-64 (C64) chip employs a multithreaded architecture that integrates a large number of hardware thread units on a single chip. A cellular supercomputer is being deve...
Ge Gan, Ziang Hu, Juan del Cuvillo, Guang R. Gao
JCP
2008
126views more  JCP 2008»
14 years 9 months ago
Hardware/Software Co-design Approach for an ADALINE Based Adaptive Control System
Abstract--In this paper, we report some results on hardware and software co-design of an adaptive linear neuron (ADALINE) based control system. A discrete-time Proportional-Integra...
Shouling He, Xuping Xu