4670 search results - page 47 / 934 » Testing that distributions are close |
IMC
2010
ACM
14 years 8 months ago
2010
ACM
How fast is the network? The speed at which real users can download content at different locations and at different times is an important metric for service providers. Knowledge o...
VLSID
2002
IEEE
15 years 10 months ago
2002
IEEE
| This paper reports the design of a Test Pattern Generator (TPG) for VLSI circuits. The onchip TPG is so designed that it generates test patterns while avoiding generation of a gi...
ITC
1997
IEEE
15 years 2 months ago
1997
IEEE
As the sizes of general and special purpose processors increase rapidly, generating high quality manufacturing tests for them is becoming a serious problem in industry. This paper...
IDA
2000
Springer
14 years 9 months ago
2000
Springer
When high-dimensional data vectors are visualized on a two- or three-dimensional display, the goal is that two vectors close to each other in the multi-dimensional space should als...
CONCUR
1999
Springer
15 years 2 months ago
1999
Springer
This paper discusses the use of formal methods in testing of concurrent systems. It is argued that formal methods and testing can be mutually profitable and useful. A framework fo...