This paper describes a technique which uses the Differential Non Linearity (DNL) test data for fault location and identification of the analog components of a flash ADC. In a flash...
As we approach 100nm technology the interconnect issues are becoming one of the main concerns in the testing of gigahertz system-onchips. Voltage distortion (noise) and delay viol...
We introduce JTorX, a tool for model-driven test derivation and execution, based on the ioco theory. This theory, originally presented in [12], has been refined in [13] with test-...
Let S be a p × p random matrix having a Wishart distribution Wp(n, n−1Σ). For testing a general covariance structure Σ = Σ(ξ), we consider a class of test statistics Th = n...
: Ranking theory delivers an account of iterated contraction; each ranking function induces a specific iterated contraction behavior. The paper gives a complete axiomatization of t...