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MTV
2006
IEEE
98views Hardware» more  MTV 2006»
16 years 8 days ago
Directed Micro-architectural Test Generation for an Industrial Processor: A Case Study
Simulation-based validation of the current industrial processors typically use huge number of test programs generated at instruction set architecture (ISA) level. However, archite...
Heon-Mo Koo, Prabhat Mishra, Jayanta Bhadra, Magdy...
ISESE
2005
IEEE
15 years 12 months ago
Exploratory testing: a multiple case study
Exploratory testing (ET) – simultaneous learning, test design, and test execution – is an applied practice in industry but lacks research. We present the current knowledge of ...
Juha Itkonen, Kristian Rautiainen
ICCS
2005
Springer
15 years 11 months ago
Model-Based Statistical Testing of a Cluster Utility
Abstract. As High Performance Computing becomes more collaborative, software certification practices are needed to quantify the credibility of shared applications. To demonstrate q...
W. Thomas Swain, Stephen L. Scott
189
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ITC
1993
IEEE
148views Hardware» more  ITC 1993»
15 years 10 months ago
DELTEST: Deterministic Test Generation for Gate-Delay Faults
This paper presents an efficient approach to generate tests for gate delay faults. Unlike other known algorithms which try to generate a 'good' delay test the presented ...
Udo Mahlstedt
DATE
2009
IEEE
105views Hardware» more  DATE 2009»
16 years 1 months ago
Enrichment of limited training sets in machine-learning-based analog/RF test
Abstract— This paper discusses the generation of informationrich, arbitrarily-large synthetic data sets which can be used to (a) efficiently learn tests that correlate a set of ...
Haralampos-G. D. Stratigopoulos, Salvador Mir, Yio...