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VLSID
1995
IEEE
107views VLSI» more  VLSID 1995»
15 years 1 months ago
Functional test generation for non-scan sequential circuits
Mandyam-Komar Srinivas, James Jacob, Vishwani D. A...
APPROX
2010
Springer
131views Algorithms» more  APPROX 2010»
14 years 11 months ago
Testing Boolean Function Isomorphism
Noga Alon, Eric Blais
SODA
1992
ACM
90views Algorithms» more  SODA 1992»
14 years 11 months ago
Self-Testing Polynomial Functions Efficiently and Over Rational Domains
In this paper we give the first self-testers and checkers for polynomials over rational and integer domains. We also show significantly stronger bounds on the efficiency of a simp...
Ronitt Rubinfeld, Madhu Sudan