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ASAP
2005
IEEE
165views Hardware» more  ASAP 2005»
15 years 3 months ago
CONAN - A Design Exploration Framework for Reliable Nano-Electronics
In this paper we introduce a design methodology that allows the system/circuit designer to build reliable systems out of unreliable nano-scale components. The central point of our...
Sorin Cotofana, Alexandre Schmid, Yusuf Leblebici,...
EMSOFT
2005
Springer
15 years 3 months ago
Compiler-guided register reliability improvement against soft errors
With the scaling of technology, transient errors caused by external particle strikes have become a critical challenge for microprocessor design. As embedded processors are widely ...
Jun Yan, Wei Zhang
OSDI
1996
ACM
14 years 11 months ago
Microkernels Meet Recursive Virtual Machines
This paper describes a novel approach to providingmodular and extensible operating system functionality and encapsulated environments based on a synthesis of microkernel and virtu...
Bryan Ford, Mike Hibler, Jay Lepreau, Patrick Tull...
ISCA
2009
IEEE
159views Hardware» more  ISCA 2009»
15 years 4 months ago
End-to-end register data-flow continuous self-test
While Moore’s Law predicts the ability of semi-conductor industry to engineer smaller and more efficient transistors and circuits, there are serious issues not contemplated in t...
Javier Carretero, Pedro Chaparro, Xavier Vera, Jau...
ICCCN
2008
IEEE
15 years 4 months ago
A Trust Model Robust to Slander Attacks in Ad Hoc Networks
— Slander attacks represent a significant danger to distributed reputation systems. Malicious nodes may collude to lie about the reputation of a particular neighbor and cause se...
Pedro B. Velloso, Rafael P. Laufer, Otto Carlos Mu...