This paper presents an overview of test techniques that offer promising features when Built-In-Self-Test (BIST) must be applied to complex intgrated systems including analog, mixed...
Manuel J. Barragan Asian, Gloria Huertas, Adoraci&...
We consider testing directed graphs for being Eulerian in the orientation model introduced in [15]. Despite the local nature of the property of being Eulerian, it turns out to be ...
Eldar Fischer, Oded Lachish, Ilan Newman, Arie Mat...
This paper introduces a new method for generating test data that combines the benefits of equivalence partitioning, boundary value analysis and cause-effect analysis. It is suitab...
Abstract—Test coverage such as branch coverage is commonly measured to assess the sufficiency of test inputs. To reduce tedious manual efforts in generating high-covering test i...
Nuo Li, Tao Xie, Nikolai Tillmann, Jonathan de Hal...
: In this paper we study Complex Read Faults in SRAMs, a combination of various malfunctions that affect the read operation in nanoscale memories. All the memory elements involved ...