(Some) Open Problems to Incorporate BIST in Complex Heterogeneous Integrated Systems

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This paper presents an overview of test techniques that offer promising features when Built-In-Self-Test (BIST) must be applied to complex intgrated systems including analog, mixed-signal and RF parts. Emphasis is on techniques exhibiting a good trade-off between test requirements (basically in terms of signal accuracy and frequency) and test quality.

Manuel J. Barragan Asian, Gloria Huertas, Adoraci&

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DELTA 2010 | Information Technology | RF Parts | Test Requirements | Test Techniques |

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Added	24 Jan 2011
Updated	24 Jan 2011
Type	Journal
Year	2010
Where	DELTA
Authors	Manuel J. Barragan Asian, Gloria Huertas, Adoración Rueda, José Luis Huertas

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(Some) Open Problems to Incorporate BIST in Complex Heterogeneous Integrated Systems

DELTA 2010 | Information Technology | RF Parts | Test Requirements | Test Techniques |

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