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» The Complexity of Forecast Testing
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AGILEDC
2007
IEEE
15 years 10 months ago
On the Sustained Use of a Test-Driven Development Practice at IBM
Test-Driven Development (TDD) is an agile practice that is widely accepted and advocated by most agile methods and methodologists. In this paper, we report on a post hoc analysis ...
Julio Cesar Sanchez, Laurie A. Williams, E. Michae...
118
Voted
FASE
2007
Springer
15 years 10 months ago
Testing Scenario-Based Models
The play-in/play-out approach suggests a new paradigm for system development using scenario-based requirements. It allows the user to develop a high level scenario-based model of t...
Hillel Kugler, Michael J. Stern, E. Jane Albert Hu...
186
Voted
SIGSOFT
2010
ACM
14 years 10 months ago
Evolution of a bluetooth test application product line: a case study
In this paper, we study the decision making process involved in the five year lifecycle of a Bluetooth software product produced by a large, multi-national test and measurement fi...
Narayan Ramasubbu, Rajesh Krishna Balan
130
Voted
VTS
2007
IEEE
71views Hardware» more  VTS 2007»
15 years 10 months ago
Optimizing Test Length for Soft Faults in DRAM Devices
: Soft faults in DRAMs are faults that do not get sensitized directly after an operation is performed, but require a time to pass before the fault can be detected. Tests developed ...
Zaid Al-Ars, Said Hamdioui, Georgi Gaydadjiev
DATE
2005
IEEE
96views Hardware» more  DATE 2005»
15 years 9 months ago
Framework for Fault Analysis and Test Generation in DRAMs
Abstract: With the increasing complexity of memory behavior, attempts are being made to come up with a methodical approach that employs electrical simulation to tackle the memory t...
Zaid Al-Ars, Said Hamdioui, Georg Mueller, A. J. v...