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» The Complexity of Forecast Testing
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AGILEDC
2007
IEEE
15 years 4 months ago
On the Sustained Use of a Test-Driven Development Practice at IBM
Test-Driven Development (TDD) is an agile practice that is widely accepted and advocated by most agile methods and methodologists. In this paper, we report on a post hoc analysis ...
Julio Cesar Sanchez, Laurie A. Williams, E. Michae...
FASE
2007
Springer
15 years 3 months ago
Testing Scenario-Based Models
The play-in/play-out approach suggests a new paradigm for system development using scenario-based requirements. It allows the user to develop a high level scenario-based model of t...
Hillel Kugler, Michael J. Stern, E. Jane Albert Hu...
SIGSOFT
2010
ACM
14 years 4 months ago
Evolution of a bluetooth test application product line: a case study
In this paper, we study the decision making process involved in the five year lifecycle of a Bluetooth software product produced by a large, multi-national test and measurement fi...
Narayan Ramasubbu, Rajesh Krishna Balan
VTS
2007
IEEE
71views Hardware» more  VTS 2007»
15 years 4 months ago
Optimizing Test Length for Soft Faults in DRAM Devices
: Soft faults in DRAMs are faults that do not get sensitized directly after an operation is performed, but require a time to pass before the fault can be detected. Tests developed ...
Zaid Al-Ars, Said Hamdioui, Georgi Gaydadjiev
DATE
2005
IEEE
96views Hardware» more  DATE 2005»
15 years 3 months ago
Framework for Fault Analysis and Test Generation in DRAMs
Abstract: With the increasing complexity of memory behavior, attempts are being made to come up with a methodical approach that employs electrical simulation to tackle the memory t...
Zaid Al-Ars, Said Hamdioui, Georg Mueller, A. J. v...