225 search results - page 8 / 45 » The Design and Optimization of SOC Test Solutions |
DSD
2005
IEEE
15 years 3 months ago
2005
IEEE
The increasing amount of test data needed to test SOC (System-on-Chip) entails efficient design of the TAM (test access mechanism), which is used to transport test data inside the...
DAC
2008
ACM
15 years 10 months ago
2008
ACM
In modular testing of system-on-a-chip (SoC), test access mechanisms (TAMs) are used to transport test data between the input/output pins of the SoC and the cores under test. Prio...
DAC
2002
ACM
15 years 10 months ago
2002
ACM
The next generation of computer chips will continue the trend for more complexity than their predecessors. Many of them will contain different chip technologies and are termed SoC...
MTDT
2003
IEEE
15 years 2 months ago
2003
IEEE
ct Defect-based testing for digital logic concentrates primarily on methods of test application, including for example at-speed structural tests and IDDQ testing. In contrast, defe...
SLIP
2006
ACM
15 years 3 months ago
2006
ACM
— The increasing gap between design productivity and chip complexity and the emerging Systems-On-Chip (SOC) architectural template have led to the wide utilization of reusable ha...