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DAC
2008
ACM
16 years 2 months ago
On reliable modular testing with vulnerable test access mechanisms
In modular testing of system-on-a-chip (SoC), test access mechanisms (TAMs) are used to transport test data between the input/output pins of the SoC and the cores under test. Prio...
Lin Huang, Feng Yuan, Qiang Xu
TCAD
2008
114views more  TCAD 2008»
15 years 1 months ago
Test-Quality/Cost Optimization Using Output-Deviation-Based Reordering of Test Patterns
At-speed functional testing, delay testing, and n-detection test sets are being used today to detect deep submicrometer defects. However, the resulting test data volumes are too hi...
Zhanglei Wang, Krishnendu Chakrabarty
TAICPART
2010
IEEE
126views Education» more  TAICPART 2010»
14 years 11 months ago
Improved Testing through Refactoring: Experience from the ProTest Project
We report on how the Wrangler refactoring tool has been used to improve and transform test code for Erlang systems. This has been achieved through the removal of code clones, the i...
Huiqing Li, Simon J. Thompson
DATE
2008
IEEE
104views Hardware» more  DATE 2008»
15 years 7 months ago
Multi-Vector Tests: A Path to Perfect Error-Rate Testing
The importance of testing approaches that exploit error tolerance to improve yield has previously been established. Error rate, defined as the percentage of vectors for which the...
Shideh Shahidi, Sandeep Gupta
IWPSE
2007
IEEE
15 years 7 months ago
Talking tests: an empirical assessment of the role of fit acceptance tests in clarifying requirements
The starting point for software evolution is usually a change request, expressing the new or updated requirements on the delivered system. The requirements specified in a change ...
Filippo Ricca, Marco Torchiano, Mariano Ceccato, P...