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NIPS
2007
15 years 2 months ago
A Kernel Statistical Test of Independence
Although kernel measures of independence have been widely applied in machine learning (notably in kernel ICA), there is as yet no method to determine whether they have detected st...
Arthur Gretton, Kenji Fukumizu, Choon Hui Teo, Le ...
TIT
1998
78views more  TIT 1998»
15 years 1 months ago
A Detection Optimal Min-Max Test for Transient Signals
—Page’s test is optimal for detecting a permanent change in distribution, in the sense that it minimizes the worst case average delay to detection given an average distance bet...
Chunming Han, Peter K. Willett 0002, Biao Chen, Do...
TCAD
2010
94views more  TCAD 2010»
14 years 8 months ago
An Efficient Projector-Based Passivity Test for Descriptor Systems
Abstract--An efficient passivity test based on canonical projector techniques is proposed for descriptor systems (DSs) widely encountered in circuit and system modeling. The test f...
Zheng Zhang, Ngai Wong
DAC
2000
ACM
16 years 2 months ago
System chip test: how will it impact your design?
A major challenge in realizing core-based system chips is the adoption and design-in of adequate test and diagnosis strategies. This tutorial paper discusses the specific challeng...
Yervant Zorian, Erik Jan Marinissen
GLVLSI
2008
IEEE
157views VLSI» more  GLVLSI 2008»
15 years 8 months ago
Coverage-driven automatic test generation for uml activity diagrams
Due to the increasing complexity of today’s embedded systems, the analysis and validation of such systems is becoming a major challenge. UML is gradually adopted in the embedded...
Mingsong Chen, Prabhat Mishra, Dhrubajyoti Kalita