64 search results - page 11 / 13 » The Impact of Silicon Photonics |
ICCAD
2010
IEEE
14 years 7 months ago
2010
IEEE
With aggressive technology scaling, integrated circuits suffer from everincreasing wearout effects and their lifetime reliability has become a serious concern for the industry. Fo...
JUCS
2006
14 years 9 months ago
2006
Abstract: Advances in technology now make it possible to integrate hundreds of cores (e.g. general or special purpose processors, embedded memories, application specific components...
102
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HPCA
2006
IEEE
15 years 10 months ago
2006
IEEE
As silicon technologies move into the nanometer regime, transistor reliability is expected to wane as devices become subject to extreme process variation, particle-induced transie...
FPGA
2010
ACM
15 years 6 months ago
2010
ACM
Guarded evaluation is a power reduction technique that involves identifying sub-circuits (within a larger circuit) whose inputs can be held constant (guarded) at specific times d...
ISPASS
2009
IEEE
15 years 4 months ago
2009
IEEE
In temperature-aware design, the presence or absence of a heatsink fundamentally changes the thermal behavior with important design implications. In recent years, chip-level infra...