59 search results - page 8 / 12 » The Impact of Technology Scaling on Lifetime Reliability |
132
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TC
2011
14 years 4 months ago
2011
—Aggressive technology scaling to 45nm and below introduces serious reliability challenges to the design of microprocessors. Since a large fraction of chip area is devoted to on-...
DATE
2007
IEEE
15 years 3 months ago
2007
IEEE
Extreme transistor scaling trends in silicon technology are soon to reach a point where manufactured systems will suffer from limited device reliability and severely reduced life...
ASPLOS
2006
ACM
15 years 3 months ago
2006
ACM
The sustained push toward smaller and smaller technology sizes has reached a point where device reliability has moved to the forefront of concerns for next-generation designs. Sil...
100
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GLVLSI
2006
IEEE
15 years 3 months ago
2006
IEEE
As CMOS devices and operating voltages are scaled down, noise and defective devices will impact the reliability of digital circuits. Probabilistic computing compatible with CMOS o...
SIGMETRICS
2011
ACM
14 years 9 days ago
2011
ACM
The amount of charge stored in an SRAM cell shrinks rapidly with each technology generation thus increasingly exposing caches to soft errors. Benchmarking the FIT rate of caches d...