5990 search results - page 409 / 1198 » The Sampling Analysis Pattern |
175
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CSB
2005
IEEE
15 years 8 months ago
2005
IEEE
In microarray classification we are faced with a very large number of features and very few training samples. This is a challenge for classical Linear Discriminant Analysis (LDA),...
179
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FMCAD
2008
Springer
15 years 8 months ago
2008
Springer
Post-silicon debug is the problem of determining what's wrong when the fabricated chip of a new design behaves incorrectly. This problem now consumes over half of the overall ...
160
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ECIS
2003
15 years 7 months ago
2003
Researches that have recently investigated the impact of developments in Information Technologies (IT) on human capital in the banking industry analysed only marginally the evolut...
193
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ICML
2010
IEEE
15 years 7 months ago
2010
IEEE
Many modern visual recognition algorithms incorporate a step of spatial `pooling', where the outputs of several nearby feature detectors are combined into a local or global `...
167
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CORR
2010
Springer
15 years 6 months ago
2010
Springer
We formulate weighted graph clustering as a prediction problem1 : given a subset of edge weights we analyze the ability of graph clustering to predict the remaining edge weights. ...