Local monitoring is an effective mechanism for the security of wireless sensor networks (WSNs). Existing schemes assume the existence of sufficient number of active nodes to carry...
— Three-dimensional die stacking integration provides the ability to stack multiple layers of processed silicon with a large number of vertical interconnects. Through Silicon Via...
Igor Loi, Subhasish Mitra, Thomas H. Lee, Shinobu ...
This paper presents a new methodology for system-level power and performance analysis of wireless multimedia systems. More precisely, we introduce an analytical approach based on ...
Radu Marculescu, Amit Nandi, Luciano Lavagno, Albe...
The purpose of this work is the proposal of a 10-Bit / 1 MSPS Analog to Digital Converter (ADC) with error correction to match the requirements of a CMOS wavefront sensor for opht...
Double patterning lithography seems to be a prominent choice for 32nm and 22nm technologies. Double patterning lithography techniques require additional masks for a single interco...
Kwangok Jeong, Andrew B. Kahng, Rasit Onur Topalog...