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» The Simulation and Design of Integrated Inductors
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MOBIHOC
2008
ACM
15 years 9 months ago
Self-monitoring for sensor networks
Local monitoring is an effective mechanism for the security of wireless sensor networks (WSNs). Existing schemes assume the existence of sufficient number of active nodes to carry...
Dezun Dong, Yunhao Liu, Xiangke Liao
ICCAD
2008
IEEE
161views Hardware» more  ICCAD 2008»
15 years 6 months ago
A low-overhead fault tolerance scheme for TSV-based 3D network on chip links
— Three-dimensional die stacking integration provides the ability to stack multiple layers of processed silicon with a large number of vertical interconnects. Through Silicon Via...
Igor Loi, Subhasish Mitra, Thomas H. Lee, Shinobu ...
ICCAD
2001
IEEE
106views Hardware» more  ICCAD 2001»
15 years 6 months ago
System-Level Power/Performance Analysis of Portable Multimedia Systems Communicating over Wireless Channels
This paper presents a new methodology for system-level power and performance analysis of wireless multimedia systems. More precisely, we introduce an analytical approach based on ...
Radu Marculescu, Amit Nandi, Luciano Lavagno, Albe...
SBCCI
2009
ACM
145views VLSI» more  SBCCI 2009»
15 years 4 months ago
Pipelined successive approximation conversion (PSAC) with error correction for a CMOS ophthalmic sensor
The purpose of this work is the proposal of a 10-Bit / 1 MSPS Analog to Digital Converter (ADC) with error correction to match the requirements of a CMOS wavefront sensor for opht...
Frank Sill, Davies W. de Lima Monteiro
SLIP
2009
ACM
15 years 4 months ago
Is overlay error more important than interconnect variations in double patterning?
Double patterning lithography seems to be a prominent choice for 32nm and 22nm technologies. Double patterning lithography techniques require additional masks for a single interco...
Kwangok Jeong, Andrew B. Kahng, Rasit Onur Topalog...