Sciweavers

4305 search results - page 114 / 861
» The Test of Time
Sort
View
DATE
2005
IEEE
107views Hardware» more  DATE 2005»
15 years 11 months ago
Test Planning for Mixed-Signal SOCs with Wrapped Analog Cores
Many SOCs today contain both digital and analog embedded cores. Even though the test cost for such mixed-signal SOCs is significantly higher than that for digital SOCs, most prio...
Anuja Sehgal, Fang Liu, Sule Ozev, Krishnendu Chak...
KBSE
2007
IEEE
16 years 10 days ago
Scalable automatic test data generation from modeling diagrams
We explore the automatic generation of test data that respect constraints expressed in the Object-Role Modeling (ORM) language. ORM is a popular conceptual modeling language, prim...
Yannis Smaragdakis, Christoph Csallner, Ranjith Su...
ICALP
2010
Springer
15 years 11 months ago
On the Relation between Polynomial Identity Testing and Finding Variable Disjoint Factors
We say that a polynomial f(x1, . . . , xn) is indecomposable if it cannot be written as a product of two polynomials that are defined over disjoint sets of variables. The polynom...
Amir Shpilka, Ilya Volkovich
156
Voted
SAC
2003
ACM
15 years 11 months ago
An Initial Investigation of Test Driven Development in Industry
Test Driven Development (TDD) is a software development practice in which unit test cases are incrementally written prior to code implementation. In our research, we ran a set of ...
Boby George, Laurie A. Williams
CCGRID
2007
IEEE
16 years 13 days ago
Build-and-Test Workloads for Grid Middleware: Problem, Analysis, and Applications
The Grid promise is starting to materialize today: largescale multi-site infrastructures have grown to assist the work of scientists from all around the world. This tremendous gro...
Alexandru Iosup, Dick H. J. Epema