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DAC
2007
ACM
16 years 7 months ago
Scan Test Planning for Power Reduction
Many STUMPS architectures found in current chip designs allow disabling of individual scan chains for debug and diagnosis. In a recent paper it has been shown that this feature can...
Christian G. Zoellin, Hans-Joachim Wunderlich, Jen...
SSIRI
2010
15 years 10 months ago
An Industrial Case Study on Speeding Up User Acceptance Testing by Mining Execution Logs
—Software reliability is defined as the probability of failure-free operation for a period of time, under certain conditions. To determine whether the reliability of an applicat...
Zhen Ming Jiang, Alberto Avritzer, Emad Shihab, Ah...
ICCD
2005
IEEE
131views Hardware» more  ICCD 2005»
16 years 3 months ago
A Flexible Design Methodology for Analog Test Wrappers in Mixed-Signal SOCs
The manufacturing test cost for mixed-signal SOCs is widely recognized to be much higher than that for digital SOCs. It has been shown in recent prior work that the use of analog ...
Anuja Sehgal, Sule Ozev, Krishnendu Chakrabarty
113
Voted
CHI
2005
ACM
16 years 6 months ago
A meeting browser evaluation test
We introduce a browser evaluation test (BET), and describe a trial run application of the test. BET is a method for assessing meeting browser performance using the number of obser...
Pierre Wellner, Mike Flynn, Simon Tucker, Steve Wh...
154
Voted
ESEM
2009
ACM
16 years 18 days ago
Usability testing with total-effort metrics
Usability testing activities have numerous benefits in theory, yet they are often overlooked or disregarded in practice. A testing paradigm which yields objective, quantitative re...
Liam Feldman, Carl J. Mueller, Dan E. Tamir, Oleg ...