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EMSOFT
2005
Springer
15 years 11 months ago
Random testing of interrupt-driven software
Interrupt-driven embedded software is hard to thoroughly test since it usually contains a very large number of executable paths. Developers can test more of these paths using rand...
John Regehr
EVOW
2001
Springer
15 years 10 months ago
ARPIA: A High-Level Evolutionary Test Signal Generator
The integrated circuits design flow is rapidly moving towards higher description levels. However, test-related activities are lacking behind this trend, mainly since effective faul...
Fulvio Corno, Gianluca Cumani, Matteo Sonza Reorda...
ICCAD
1997
IEEE
144views Hardware» more  ICCAD 1997»
15 years 10 months ago
Partial scan delay fault testing of asynchronous circuits
Asynchronous circuits operate correctly only under timing assumptions. Hence testing those circuits for delay faults is crucial. This paper describes a three-step method to detect...
Michael Kishinevsky, Alex Kondratyev, Luciano Lava...
163
Voted
DBSEC
2008
137views Database» more  DBSEC 2008»
15 years 7 months ago
Towards Automation of Testing High-Level Security Properties
Abstract. Many security problems only become apparent after software is deployed, and in many cases a failure has occurred prior to the awareness of the problem. Although many woul...
Aiman Hanna, Hai Zhou Ling, Jason Furlong, Mourad ...
145
Voted
CEC
2007
IEEE
16 years 14 days ago
Estimation of distribution algorithms for testing object oriented software
— One of the main tasks software testing involves is the generation of the test cases to be used during the test. Due to its expensive cost, the automation of this task has becom...
Ramón Sagarna, Andrea Arcuri, Xin Yao