4305 search results - page 136 / 861 » The Test of Time |
150
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ERLANG
2008
ACM
15 years 8 months ago
2008
ACM
When creating software, data types are the basic bricks. Most of the time a programmer will use data types defined in library modules, therefore being tested by many users over ma...
202
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DFT
2006
IEEE
16 years 9 days ago
2006
IEEE
This paper describes a methodology of creating a built-in diagnostic system of a System on Chip and experimental results of the system application on the AT94K FPSLIC with cores d...
141
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DATE
2005
IEEE
15 years 12 months ago
2005
IEEE
Both the number of embedded memories, as well as the total embedded memory content in our chips is growing steadily. Time for chip designers, EDA makers, and test engineers to upd...
160
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COLT
2008
Springer
15 years 8 months ago
2008
Springer
We define a model of learning probabilistic acyclic circuits using value injection queries, in which an arbitrary subset of wires is set to fixed values, and the value on the sing...
172
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ICCAD
2008
IEEE
16 years 3 months ago
2008
IEEE
Abstract— Process variations make at-speed testing significantly more difficult. They cause subtle delay changes that are distributed rather than the localized nature of a trad...