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ECRTS
2004
IEEE
15 years 3 months ago
2004
IEEE
The problem of feasibility analysis for asynchronous periodic task sets (i.e. where tasks can have an initial offset) is known to be co-NP-complete in the strong sense. A sufficie...
SAC
2002
ACM
14 years 11 months ago
2002
ACM
The cost for testing integrated circuits represents a growing percentage of the total cost for their production. The former strictly depends on the length of the test session, and...
IPPS
1998
IEEE
15 years 4 months ago
1998
IEEE
We propose a periodic diagnostic algorithm based on the testing model of computation for real-time systems. The diagnostic task runs on every processor of the system. When the task...
DATE
2006
IEEE
15 years 5 months ago
2006
IEEE
In this work a method to improve the loopback test used in RF analog circuits is described. The approach is targeted to the SoC environment, being able to reuse system resources i...
ITC
1996
IEEE
15 years 4 months ago
1996
IEEE
A 25k gate Test Chip was designed and manufactured to evaluate different test methods for scan-designed circuits. The design of the chip, the experiment, and preliminary experimen...