4305 search results - page 60 / 861 » The Test of Time |
149
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ITC
1996
IEEE
15 years 10 months ago
1996
IEEE
The detectability of delay flaws can be improved by testing CMOS IC's with a very low supply voltage -between 2 and 2.5 times the threshold voltage Vt of the transistors. A d...
137
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ET
2002
15 years 5 months ago
2002
Due to technology scaling and increasing clock frequency, problems due to noise effects lead to an increase in design/debugging efforts and a decrease in circuit performance. This...
168
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ET
2002
15 years 5 months ago
2002
We propose an integrated framework for the design of SOC test solutions, which includes a set of algorithms for early design space exploration as well as extensive optimization for...
166
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KBSE
2009
IEEE
16 years 16 days ago
2009
IEEE
—Developers often change software in ways that cause tests to fail. When this occurs, developers must determine whether failures are caused by errors in the code under test or in...
140
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ATS
2003
IEEE
15 years 11 months ago
2003
IEEE
Capacitive crosstalk can give rise to slowdown of signals that can propagate to a circuit output and create a functional error. A test generation methodology, called XGEN, was dev...