4305 search results - page 78 / 861 » The Test of Time |
119
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DATE
2009
IEEE
16 years 20 days ago
2009
IEEE
— In this paper, we present an X-Fill (QC-Fill) method for not only slashing the test time but also reducing the test power (including both capture power and shifting power). QC-...
139
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DATE
2007
IEEE
16 years 7 days ago
2007
IEEE
1 This paper presents a BIST strategy for testing the NoC interconnect network, and investigates if the strategy is a suitable approach for the task. All switches and links in the ...
164
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ICSE
2005
IEEE-ACM
16 years 6 months ago
2005
IEEE-ACM
Greedy algorithms for the construction of software interaction test suites are studied. A framework is developed to evaluate a large class of greedy methods that build suites one ...
146
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TIT
2011
15 years 25 days ago
2011
—An asymptotically optimum test for the problem of decentralized sequential hypothesis testing is presented. The induced communication between sensors and fusion center is asynch...
166
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ET
2002
15 years 5 months ago
2002
Abstract. A novel approach for using an embedded processor to aid in deterministic testing of the other components of a system-on-a-chip (SOC) is presented. The tester loads a prog...