4305 search results - page 86 / 861 » The Test of Time |
172
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DATE
2003
IEEE
15 years 11 months ago
2003
IEEE
Test data compression (TDC) is a promising low-cost methodology for System-on-a-Chip (SOC) test. This is due to the fact that it can reduce not only the volume of test data but al...
162
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DATE
2004
IEEE
15 years 9 months ago
2004
IEEE
Functional verification is widely acknowledged as a major bottleneck in microprocessor design. While early work on specification driven functional test program generation has prop...
142
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VTS
1996
IEEE
15 years 10 months ago
1996
IEEE
Some weak static CMOS chips can be detected by testing them with a very low supply voltage -- between 2 and 2.5 times the threshold voltage Vt of the transistors. A weak chip is o...
155
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IPPS
2007
IEEE
16 years 7 days ago
2007
IEEE
Real-time systems using Rate Monotonic fixed priority scheduling can be checked for schedulability either by pessimistic schedulability conditions or exact testing. Exact testing ...
163
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SODA
2010
ACM
16 years 3 months ago
2010
ACM
We investigate the preemptive scheduling of periodic tasks with hard deadlines. We show that, even in the uniprocessor case, no polynomial time algorithm can test the feasibility ...