We present a novel method to efficiently generate, compress and apply test patterns in a logic BIST architecture. Patterns are generated by a modified automatic test pattern gener...
Peter Wohl, John A. Waicukauski, Sanjay Patel, Min...
Both the logic and the stochastic analysis of discrete-state systems are hindered by the combinatorial growth of the state space underlying a high-level model. In this work, we con...
In this paper we present a new reseeding technique for test-per-clock test pattern generation suitable for at-speed testing of circuits with random-pattern resistant faults. Our te...
The IMage Euclidean Distance (IMED) is a class of image metrics, in which the spatial relationship between pixels is taken into consideration. It was shown that calculating the IM...
Abstract. We introduce a new glass tile generation method for simulating Stained Glass using region segmentation algorithm and cubic spline interpolation method. We apply a Mean sh...
Sang Hyun Seo, HoChang Lee, HyunChul Nah, Kyung-hy...