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VTS
2006
IEEE
122views Hardware» more  VTS 2006»
15 years 5 months ago
Mixed PLB and Interconnect BIST for FPGAs Without Fault-Free Assumptions
We tackle the problem of fault-free assumptions in current PLB and interconnect built-in-self-test (BIST) techniques for FPGAs. These assumptions were made in order to develop stro...
Vishal Suthar, Shantanu Dutt
ACSAC
2005
IEEE
15 years 5 months ago
Automated and Safe Vulnerability Assessment
As the number of system vulnerabilities multiplies in recent years, vulnerability assessment has emerged as a powerful system security administration tool that can identify vulner...
Fanglu Guo, Yang Yu, Tzi-cker Chiueh
HICSS
2005
IEEE
95views Biometrics» more  HICSS 2005»
15 years 5 months ago
Understanding the Effect of Risk Aversion on Risk
As we progress, society must intelligently address the following question: How much risk is acceptable? How we answer this question could have important consequences for the futur...
U. S. Bhatt, David E. Newman, Benjamin A. Carreras...
HPDC
2005
IEEE
15 years 5 months ago
Generosity and gluttony in GEMS: grid enabled molecular simulations
Biomolecular simulations produce more output data than can be managed effectively by traditional computing systems. Researchers need distributed systems that allow the pooling of...
Justin M. Wozniak, Paul Brenner, Douglas Thain, Aa...
INFOCOM
2005
IEEE
15 years 5 months ago
Dynamic node activation in networks of rechargeable sensors
— We consider a network of rechargeable sensors, deployed redundantly in a random sensing environment, and address the problem of how sensor nodes should be activated dynamically...
Koushik Kar, Ananth Krishnamurthy, Neeraj Jaggi