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KDD
2001
ACM
150views Data Mining» more  KDD 2001»
16 years 7 days ago
Empirical bayes screening for multi-item associations
This paper considers the framework of the so-called "market basket problem", in which a database of transactions is mined for the occurrence of unusually frequent item s...
William DuMouchel, Daryl Pregibon
CHI
2006
ACM
16 years 7 days ago
"Sketching" nurturing creativity: commonalities in art, design, engineering and research
icians or philosophers use abstract symbols to derive formulas or form proofs. Indeed, these sketches are structural geometric proofs, consistent with Plato's supposition that...
Kumiyo Nakakoji, Atau Tanaka, Daniel Fallman
CHI
2005
ACM
16 years 7 days ago
Digital Family Portrait Field Trial: Support for Aging in Place
A growing social problem in the U.S., and elsewhere, is enabling older adults to continue living independently, as opposed to moving to an institutional care setting. One key part...
Jim Rowan, Elizabeth D. Mynatt
VLSID
2006
IEEE
150views VLSI» more  VLSID 2006»
16 years 6 days ago
A Comprehensive SoC Design Methodology for Nanometer Design Challenges
SoC design methodologies are under constant revision due to adoption of fast shrinking process technologies at nanometer levels. Nanometer process geometries exhibit new complex d...
R. Raghavendra Kumar, Ricky Bedi, Ramadas Rajagopa...
VLSID
2006
IEEE
129views VLSI» more  VLSID 2006»
16 years 6 days ago
A Stimulus-Free Probabilistic Model for Single-Event-Upset Sensitivity
With device size shrinking and fast rising frequency ranges, effect of cosmic radiations and alpha particles known as Single-Event-Upset (SEU), Single-Eventtransients (SET), is a ...
Mohammad Gh. Mohammad, Laila Terkawi, Muna Albasma...