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» Time, Hardware, and Uniformity
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ITC
2003
IEEE
115views Hardware» more  ITC 2003»
15 years 7 months ago
Structural Delay Testing of Latch-based High-speed Pipelines with Time Borrowing
Kun Young Chung, Sandeep K. Gupta
ISCAS
2002
IEEE
85views Hardware» more  ISCAS 2002»
15 years 6 months ago
Automated test development and test time reduction for RF subsystems
Sule Ozev, Alex Orailoglu, Hosam Haggag