2994 search results - page 200 / 599 » Time sequences |
107
Voted
ATS
2009
IEEE
15 years 10 months ago
2009
IEEE
High performance designs often use the on-chip device PLLs for accurate test clock generation during testing. The on-chip clock generator is designed in a programmable way to faci...
119
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ESA
2005
Springer
15 years 9 months ago
2005
Springer
We present fully dynamic algorithms for maintaining 3- and 5-spanners of undirected graphs under a sequence of update operations. For unweighted graphs we maintain a 3or 5-spanner...
129
Voted
DFT
2006
IEEE
15 years 9 months ago
2006
IEEE
1 High temperature has become a major problem for system-on-chip testing. In order to reduce the test time while keeping the temperature of the chip under test within a safe range,...
150
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CLEF
2009
Springer
15 years 1 months ago
2009
Springer
The robot vision task has been proposed to the ImageCLEF participants for the first time in 2009. The task attracted a considerable attention, with 19 inscribed research groups, 7...
125
Voted
ICIP
2004
IEEE
16 years 5 months ago
2004
IEEE
We propose a solution to the problem of object recognition given a continuous video sequence containing multiple views of an object. Initially, object models are acquired from ima...