Late CMOS scaling reduces device reliability, and existing work has studied the permanent SER (soft error rate) for configuration memory in FPGA extensively. In this paper, we sh...
Abstract--As demand increases for circuits with higher performance, higher complexity, and decreased feature size, asynchronous (clockless) paradigms will become more widely used i...
It has become clear that on-chip storage is an essential component of high-density FPGAs. These arrays were originally intended to implement storage, but recent work has shown tha...
Existing optimization algorithms for the multiplierless realization of multiple constant multiplications (MCM) typically target the minimization of the number of addition and subt...
Levent Aksoy, Eduardo Costa, Paulo F. Flores, Jos&...
Negative Bias Temperature Instability (NBTI), a PMOS aging phenomenon causing significant loss on circuit performance and lifetime, has become a critical challenge for temporal re...