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107
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DAC
2010
ACM
15 years 4 months ago
Performance yield-driven task allocation and scheduling for MPSoCs under process variation
With the ever-increasing transistor variability in CMOS technology, it is essential to integrate variation-aware performance analysis into the task allocation and scheduling proce...
Lin Huang, Qiang Xu
105
Voted
ISLPED
2007
ACM
97views Hardware» more  ISLPED 2007»
15 years 2 months ago
Detailed placement for leakage reduction using systematic through-pitch variation
We present a novel detailed placement technique that accounts for systematic through-pitch variations to reduce leakage. Leakage depends nearly exponentially on linewidth (gate le...
Andrew B. Kahng, Swamy Muddu, Puneet Sharma
JCDL
2011
ACM
226views Education» more  JCDL 2011»
14 years 3 months ago
Measuring historical word sense variation
We describe here a method for automatically identifying word sense variation in a dated collection of historical books in a large digital library. By leveraging a small set of kno...
David Bamman, Gregory Crane
119
Voted
MICCAI
2008
Springer
16 years 1 months ago
A Variational Level Set Approach to Segmentation and Bias Correction of Images with Intensity Inhomogeneity
Abstract. This paper presents a variational level set approach to joint segmentation and bias correction of images with intensity inhomogeneity. Our method is based on an observati...
Chunming Li, Rui Huang, Zhaohua Ding, Chris Gat...
SLIP
2009
ACM
15 years 7 months ago
Is overlay error more important than interconnect variations in double patterning?
Double patterning lithography seems to be a prominent choice for 32nm and 22nm technologies. Double patterning lithography techniques require additional masks for a single interco...
Kwangok Jeong, Andrew B. Kahng, Rasit Onur Topalog...