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FPGA
2007
ACM
142views FPGA» more  FPGA 2007»
15 years 6 months ago
Parametric yield in FPGAs due to within-die delay variations: a quantitative analysis
Variations in the semiconductor fabrication process results in variability in parameters between transistors on the same die, a problem exacerbated by lithographic scaling. The re...
N. Pete Sedcole, Peter Y. K. Cheung
96
Voted
SMI
2005
IEEE
15 years 6 months ago
Curvature-based Energy for Simulation and Variational Modeling
Curvature-based energy and forces are used in a broad variety of contexts, ranging from modeling of thin plates and shells to surface fairing and variational surface design. The a...
Denis Zorin
100
Voted
GRAPHITE
2004
ACM
15 years 6 months ago
Smooth constraints for spline variational modeling
This article introduces a new class of constraints for spline variational modeling, which allows more flexible user specification, as a constrained point can ”slide” along a...
Julien Lenoir, Laurent Grisoni, Philippe Meseure, ...
DAC
2010
ACM
15 years 27 days ago
Post-silicon diagnosis of segments of failing speedpaths due to manufacturing variations
We study diagnosis of segments on speedpaths that fail the timing constraint at the post-silicon stage due to manufacturing variations. We propose a formal procedure that is appli...
Lin Xie, Azadeh Davoodi, Kewal K. Saluja
DSP
2007
15 years 20 days ago
Variational and stochastic inference for Bayesian source separation
We tackle the general linear instantaneous model (possibly underdetermined and noisy) where we model the source prior with a Student t distribution. The conjugate-exponential char...
Ali Taylan Cemgil, Cédric Févotte, S...