Variations in the semiconductor fabrication process results in variability in parameters between transistors on the same die, a problem exacerbated by lithographic scaling. The re...
Curvature-based energy and forces are used in a broad variety of contexts, ranging from modeling of thin plates and shells to surface fairing and variational surface design. The a...
This article introduces a new class of constraints for spline variational modeling, which allows more flexible user specification, as a constrained point can ”slide” along a...
Julien Lenoir, Laurent Grisoni, Philippe Meseure, ...
We study diagnosis of segments on speedpaths that fail the timing constraint at the post-silicon stage due to manufacturing variations. We propose a formal procedure that is appli...
We tackle the general linear instantaneous model (possibly underdetermined and noisy) where we model the source prior with a Student t distribution. The conjugate-exponential char...