1491 search results - page 120 / 299 » Training Linear Discriminant Analysis in Linear Time |
DATE
2003
IEEE
15 years 3 months ago
2003
IEEE
The growing impact of within-die process variation has created the need for statistical timing analysis, where gate delays are modeled as random variables. Statistical timing anal...
ICCAD
2003
IEEE
15 years 3 months ago
2003
IEEE
Process variations have become a critical issue in performance verification of high-performance designs. We present a new, statistical timing analysis method that accounts for int...
ISQED
2008
IEEE
15 years 4 months ago
2008
IEEE
Clock meshes have found increasingly wide applications in today’s high-performance IC designs. The inherent routing redundancies associated with clock meshes lead to improved cl...
SLIP
2009
ACM
15 years 4 months ago
2009
ACM
In this paper, a comprehensive and fast method is presented for the timing analysis of process variations on single-walled carbon nanotube (SWCNT) bundles. Unlike previous works t...
ICCAD
2006
IEEE
15 years 6 months ago
2006
IEEE
Abstract—Manufacturing process variations lead to circuit timing variability and a corresponding timing yield loss. Traditional corner analysis consists of checking all process c...