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GLVLSI
2008
IEEE
157views VLSI» more  GLVLSI 2008»
15 years 3 months ago
Coverage-driven automatic test generation for uml activity diagrams
Due to the increasing complexity of today’s embedded systems, the analysis and validation of such systems is becoming a major challenge. UML is gradually adopted in the embedded...
Mingsong Chen, Prabhat Mishra, Dhrubajyoti Kalita
90
Voted
DAC
2004
ACM
15 years 1 months ago
On test generation for transition faults with minimized peak power dissipation
This paper presents a method of generating tests for transition faults using tests for stuck-at faults such that the peak power is the minimum possible using a given set of tests ...
Wei Li, Sudhakar M. Reddy, Irith Pomeranz
ET
1998
52views more  ET 1998»
14 years 9 months ago
Scalable Test Generators for High-Speed Datapath Circuits
This paper explores the design of efficient test sets and test-pattern generators for online BIST. The target applications are high-performance, scalable datapath circuits for whi...
Hussain Al-Asaad, John P. Hayes, Brian T. Murray
ISSRE
2006
IEEE
15 years 3 months ago
Metamodel-based Test Generation for Model Transformations: an Algorithm and a Tool
In a Model-Driven Development context (MDE), model transformations allow memorizing and reusing design know-how, and thus automate parts of the design and refinement steps of a so...
Erwan Brottier, Franck Fleurey, Jim Steel, Benoit ...
HICSS
1998
IEEE
94views Biometrics» more  HICSS 1998»
15 years 1 months ago
An Internet-Based Platform for Testing Generation Scheduling Auctions
This paper describes the uses and architecture of a network-centered computing-rich software platform called PowerWeb. PowerWeb was designed and built as a simulation environment ...
Ray Zimmerman, Robert J. Thomas, Deqiang Gan, Carl...