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ET
2000
145views more  ET 2000»
14 years 9 months ago
Fast Test Pattern Generation for Sequential Circuits Using Decision Diagram Representations
The paper presents a novel hierarchical approach to test pattern generation for sequential circuits based on an input model of mixed-level decision diagrams. A method that handles,...
Jaan Raik, Raimund Ubar
ICWE
2005
Springer
15 years 3 months ago
Towards Model-Driven Testing of a Web Application Generator
Abstract. Conceptual modelling is a promising approach for Web application development, thanks to innovative CASE tools that can transform high-level specifications into executabl...
Luciano Baresi, Piero Fraternali, Massimo Tisi, Sa...
VTS
1998
IEEE
88views Hardware» more  VTS 1998»
15 years 1 months ago
Transition Maximization Techniques for Enhancing the Two-Pattern Fault Coverage of Pseudorandom Test Pattern Generators
This paper presents simulation evidence supporting the use of bit transition maximization techniques in the design of hardware test pattern generators TPGs. Bit transition maximiz...
Bruce F. Cockburn, Albert L.-C. Kwong
ET
1998
99views more  ET 1998»
14 years 9 months ago
A Behavior Model for Next Generation Test Systems
Defining information required by automatic test systems frequently involves a description of system behavior. To facilitate capturing the required behavior information in the cont...
Lee A. Shombert, John W. Sheppard
65
Voted
CHI
2005
ACM
15 years 9 months ago
Automatic generation of high coverage usability tests
Software systems are often complex in the number of features that are available through the user interface and consequently, the number of interactions that can occur. Such system...
Renée C. Bryce