In Proc. of IEEE Conf. on CVPR'2000, Vol.I, pp.222-227, Hilton Head Island, SC, 2000 In many vision applications, the practice of supervised learning faces several difficulti...
— Scanning transmission electron microscopes are indispensable tools for material science research, since they can reveal the internal structure of a wide range of specimens. Thu...
Arturo Tejada, Wouter Van den Broek, Saartje W. va...
Abstract—A variational approach is proposed for the unsupervised assessment of attribute variability of high-dimensional data given a differentiable similarity measure. The key q...
Abstract. In recent years the problem of object recognition has received considerable attention from both the machine learning and computer vision communities. The key challenge of...
Models such as pairwise conditional random fields (CRFs) are extremely popular in computer vision and various other machine learning disciplines. However, they have limited expre...