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DAC
2007
ACM
16 years 26 days ago
Characterization and Estimation of Circuit Reliability Degradation under NBTI using On-Line IDDQ Measurement
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
Kunhyuk Kang, Kee-Jong Kim, Ahmad E. Islam, Muhamm...
DNIS
2010
Springer
194views Database» more  DNIS 2010»
15 years 6 months ago
Interface Tailoring by Exploiting Temporality of Attributes for Small Screens
In the pervasive computing era, mobile phones and personal digital assistants are widely used for data collection. The traditional user interfaces which are employed for data colle...
Mittapally Kumara Swamy, P. Krishna Reddy, R. Uday...
PLDI
2010
ACM
15 years 9 months ago
Breadcrumbs: Efficient Context Sensitivity for Dynamic Bug Detection Analyses
Calling context--the set of active methods on the stack--is critical for understanding the dynamic behavior of large programs. Dynamic program analysis tools, however, are almost ...
Michael D. Bond, Graham Z. Baker, Samuel Z. Guyer
ICN
2009
Springer
15 years 6 months ago
Measuring Route Diversity in the Internet from Remote Vantage Points
Recent works on modeling the Internet topology [8, 9] have highlighted how the complexity of relationships between Autonomous Systems (ASes) can not be oversimplified without sac...
Andrea Di Menna, Tiziana Refice, Luca Cittadini, G...
ICASSP
2010
IEEE
15 years 2 days ago
Comparison of modulation features for phoneme recognition
In this paper, we compare several approaches for the extraction of modulation frequency features from speech signal using a phoneme recognition system. The general framework in th...
Sriram Ganapathy, Samuel Thomas, Hynek Hermansky