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VLSI
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Selective-run built-in self-test using an embedded processor
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Sungbae Hwang, Jacob A. Abraham
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Reconfigurable repetitive padding unit
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Georgi Kuzmanov, Stamatis Vassiliadis
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Properties of on-chip inductive current loops
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Andrey V. Mezhiba, Eby G. Friedman
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Multi-voltage low power convolvers using the polynomial residue number system
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Vassilis Paliouras, Alexander Skavantzos, Thanos S...
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Fast and accurate wire delay estimation for physical synthesis of large ASICs
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Ruchir Puri, David S. Kung, Anthony D. Drumm
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