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45

GLVLSI
2002
IEEE

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Selective-run built-in self-test using an embedded processor

15 years 2 months ago

Selective-run built-in self-test using an embedded processor

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Sungbae Hwang, Jacob A. Abraham

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GLVLSI 2002 | VLSI |

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Added	14 Jul 2010
Updated	14 Jul 2010
Type	Conference
Year	2002
Where	GLVLSI
Authors	Sungbae Hwang, Jacob A. Abraham

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