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157
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VLSID
2003
IEEE
16 years 5 months ago
2003
IEEE
The design of modern complex embedded systems require a high level of abstraction of the design. The SimnML[1] is a specification language to model processors for such designs. Se...
134
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VLSID
2003
IEEE
16 years 5 months ago
2003
IEEE
Reducing leakage power and improving the reliability of data stored in the memory cells are both becoming challenging as technology scales down. While the smaller threshold voltag...
100
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VLSID
2003
IEEE
16 years 5 months ago
2003
IEEE
In this paper, we provide an analytical framework to study the inter-cell and intra-cell bit-line coupling when it is superimposed with the ground bounce effect and show how those...
132
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VLSID
2003
IEEE
16 years 5 months ago
2003
IEEE
This paper introduces a Built-In Self Test (BIST) structure referred to as Universal BIST (UBIST). The Test Pattern Generator (TPG) of the proposed UBIST is designed to generate an...
125
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VLSID
2003
IEEE
16 years 5 months ago
2003
IEEE
This paper combines an adaptive supply-voltage scheme with self-timed CMOS digital design, to achieve low power performance. The supply-voltage automatically tracks the input data...