Sciweavers

2449 search results - page 404 / 490
» VLSI
Sort
View
DFT
2008
IEEE
138views VLSI» more  DFT 2008»
15 years 10 months ago
Exploring Density-Reliability Tradeoffs on Nanoscale Substrates: When do smaller less reliable devices make sense?
It is widely recognized that device and interconnect fabrics at the nanoscale will be characterized by an increased susceptibility to transient faults. This appears to be intrinsi...
Andrey V. Zykov, Gustavo de Veciana
DFT
2008
IEEE
120views VLSI» more  DFT 2008»
15 years 10 months ago
Built-in-Self-Diagnostics for a NoC-Based Reconfigurable IC for Dependable Beamforming Applications
Integrated circuits (IC) targeting at the streaming applications for tomorrow are becoming a fast growing market. Applications such as beamforming require mass computing capabilit...
Oscar Kuiken, Xiao Zhang, Hans G. Kerkhoff
DFT
2008
IEEE
117views VLSI» more  DFT 2008»
15 years 10 months ago
Impact of Technology and Voltage Scaling on the Soft Error Susceptibility in Nanoscale CMOS
With each technology node shrink, a silicon chip becomes more susceptible to soft errors. The susceptibility further increases as the voltage is scaled down to save energy. Based ...
Vikas Chandra, Robert C. Aitken
FCCM
2008
IEEE
205views VLSI» more  FCCM 2008»
15 years 10 months ago
Credit Risk Modelling using Hardware Accelerated Monte-Carlo Simulation
The recent turmoil in global credit markets has demonstrated the need for advanced modelling of credit risk, which can take into account the effects of changing economic condition...
David B. Thomas, Wayne Luk
FCCM
2008
IEEE
162views VLSI» more  FCCM 2008»
15 years 10 months ago
Multiobjective Optimization of FPGA-Based Medical Image Registration
With a multitude of technological innovations, one emerging trend in image processing, and medical image processing, in particular, is custom hardware implementation of computatio...
Omkar Dandekar, William Plishker, Shuvra S. Bhatta...