It is widely recognized that device and interconnect fabrics at the nanoscale will be characterized by an increased susceptibility to transient faults. This appears to be intrinsi...
Hardware dependability improvements have led to a situation in which it is sometimes unnecessary to employ extensive hardware replication to mask hardware faults. Expanding upon o...
Elisabeth A. Strunk, John C. Knight, M. Anthony Ai...
As safety critical systems increase in size and complexity, the need for efficient tools to verify their reliability grows. In this paper we present a tool that helps engineers des...
Parosh Aziz Abdulla, Johan Deneaux, Gunnar St&arin...
The paper addresses the issue of microprocessor and microcontroller testing, and follows an approach based on the generation of a test program. The proposed method relies on two p...
We introduce dag consistency, a relaxed consistency model for distributed shared memory which is suitable for multithreaded programming. We have implemented dag consistency in sof...
Robert D. Blumofe, Matteo Frigo, Christopher F. Jo...