1192 search results - page 18 / 239 » Variation-Aware Fault Modeling |
143
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ICSE
2003
IEEE-ACM
15 years 8 months ago
2003
IEEE-ACM
Improvements in the software development process depend on our ability to collect and analyze data drawn from various phases of the development life cycle. Our design metrics rese...
126
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GLVLSI
2002
IEEE
15 years 8 months ago
2002
IEEE
This paper develops new techniques for detecting both stuck-open faults and resistive open faults, which result in increased delays along some paths. The improved detection of CMO...
145
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COMPSAC
2011
IEEE
14 years 3 months ago
2011
IEEE
Abstract—Statistical fault localization techniques find suspicious faulty program entities in programs by comparing passed and failed executions. Existing studies show that such ...
118
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IOLTS
2006
IEEE
15 years 9 months ago
2006
IEEE
— Delay failures are becoming a dominant failure mechanism in nanometer technologies. Diagnosis of such failures is important to ensure yield and robustness of the design. Howeve...
124
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VTS
1996
IEEE
15 years 7 months ago
1996
IEEE
In this paper we investigate optimal voltage testing approaches for physically-based faults in CMOS circuits. We describe the general nature of the problem and then focus on two f...